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@inproceedings{Thornhill:2002:10.3182/20020721-6-es-1901.01620,
author = {Thornhill, NF and Xia, C and Howell, J and Cox, J and Paulonis, M},
doi = {10.3182/20020721-6-es-1901.01620},
pages = {399--404},
title = {Analysis of plant-wide disturbances through data-driven techniques and process understanding},
url = {http://dx.doi.org/10.3182/20020721-6-es-1901.01620},
year = {2002}
}

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TY  - CPAPER
AB  - Plant-wide disturbances can have an impact on product quality and running costs. Thus there is a motivation for automated detection of a plant-wide disturbance and for diagnosis of the root cause. In this article, data-driven techniques are used to analyze plant-wide disturbances caused, for instance, by limit cycle oscillation in a control loop. The control loops participating in the disturbance are detected and displayed on a process schematic. Other numerical signatures derived from the data trends are utilized for the diagnosis of the root cause. The outcome is a visual display that integrates process understanding and data-driven analysis.
AU  - Thornhill,NF
AU  - Xia,C
AU  - Howell,J
AU  - Cox,J
AU  - Paulonis,M
DO  - 10.3182/20020721-6-es-1901.01620
EP  - 404
PY  - 2002///
SN  - 1474-6670
SP  - 399
TI  - Analysis of plant-wide disturbances through data-driven techniques and process understanding
UR  - http://dx.doi.org/10.3182/20020721-6-es-1901.01620
ER  -

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