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@article{Yim:2006:10.1016/j.compchemeng.2006.05.004,
author = {Yim, SY and Ananthakumar, HG and Benabbas, L and Horch, A and Drath, R and Thornhill, NF},
doi = {10.1016/j.compchemeng.2006.05.004},
journal = {COMPUT CHEM ENG},
pages = {86--99},
title = {Using process topology in plant-wide control loop performance assessment},
url = {http://dx.doi.org/10.1016/j.compchemeng.2006.05.004},
volume = {31},
year = {2006}
}

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TY  - JOUR
AB  - This contribution describes how disturbances in a control system can be isolated and diagnosed automatically based on plant topology. In order to demonstrate this, a prototype software has been designed and implemented which, when given an electronic process schematic of a plant and results from a data-driven analysis, allows the user to pose queries about the plant and to find root causes of plant-wide disturbances. This hybrid system puts together two new technologies: the plant topology information written in XML according to the computer aided engineering exchange (CAEX) schema and the results of a signal analysis tool called plant-wide disturbance analysis (PDA). The isolation and diagnosis of the root causes of plant-wide disturbances is enhanced when process connectivity is considered alongside the results of data-driven analysis. (c) 2006 Elsevier Ltd. All rights reserved.
AU  - Yim,SY
AU  - Ananthakumar,HG
AU  - Benabbas,L
AU  - Horch,A
AU  - Drath,R
AU  - Thornhill,NF
DO  - 10.1016/j.compchemeng.2006.05.004
EP  - 99
PY  - 2006///
SN  - 0098-1354
SP  - 86
TI  - Using process topology in plant-wide control loop performance assessment
T2  - COMPUT CHEM ENG
UR  - http://dx.doi.org/10.1016/j.compchemeng.2006.05.004
UR  - http://hdl.handle.net/10044/1/14367
VL  - 31
ER  -

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