See a list of publications below or visit the Photonics academic staff page and click on a particular  member of staff to access their personal web page, which includes a list of their own publications.

Citation

BibTex format

@article{Hong:2023:10.1364/AO.500281,
author = {Hong, W and Sparks, H and Dunsby, C},
doi = {10.1364/AO.500281},
journal = {Applied Optics},
pages = {7431--7440},
title = {Alignment and characterisation of remote-refocusingsystems},
url = {http://dx.doi.org/10.1364/AO.500281},
volume = {62},
year = {2023}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - The technique of remote refocusing is used in optical microscopy to provide rapid axial scanning without mechanically perturbing the sample and in techniques such as oblique plane microscopy that build on remote refocusing to image a tilted plane within the sample. The magnification between the pupils of the primary (O1) and secondary (O2) microscope objectives of the remote-refocusing system has been shown previously by Mohanan and Corbett [J. Microsc. 288, 95 (2022) [CrossRef] ] to be crucial in obtaining the broadest possible remote-refocusing range. In this work, we performed an initial alignment of a remote-refocusing system and then studied the effect of axial misalignments of O1 and O2, axial misalignment of the primary tube lens (TL1) relative to the secondary tube lens (TL2), lateral misalignments of TL2, and changes in the focal length of TL2. For each instance of the setup, we measured the mean point spread function FWHMxy of 100 nm fluorescent beads and the normalized bead integrated fluorescence signal, and we calculated the axial and lateral distortion of the system; all of these quantities were mapped over the remote-refocusing range and as a function of lateral image position. This allowed us to estimate the volume over which diffraction-limited performance is achieved and how this changes with the alignment of the system.
AU - Hong,W
AU - Sparks,H
AU - Dunsby,C
DO - 10.1364/AO.500281
EP - 7440
PY - 2023///
SN - 1559-128X
SP - 7431
TI - Alignment and characterisation of remote-refocusingsystems
T2 - Applied Optics
UR - http://dx.doi.org/10.1364/AO.500281
UR - https://doi.org/10.1364/AO.500281
UR - http://hdl.handle.net/10044/1/106545
VL - 62
ER -