This centre for electron microscopy provides modern facilities for advanced materials imaging and characterisation. The facilities include three scanning electron microscopes (SEMs) and three transmission electron microscopes (TEMs), the latest being the state-of-the-art monochromated FEI TITAN 80/300 and FEI Helios NanoLab 600 DualBeam. In addition, the dedicated microscopy team maintain the latest technology in the two sample preparation labs and data processing suite.
- Local Electrode Atom Probe (LEAP 5000)
- FEI Quanta FEGESEM
- Zeiss LEO Gemini 1525 SEM
- Zeiss Sigma 300 SEM
- JEOL 6010LA
- TFS Helios Hydra Dual Beam FIB-SEM
- TFS Helios 5 CX
- Zeiss Auriga Cross Beam FIB-SEM
- JEOL 2100Plus TEM
- JEOL 2100F TEM
- TFS Spectra 300 TEM
- TFS Talos microscope
- Sample Preparation
- In situ SEM testing platforms
Electron Microscopy help and support
-
Professor Finn Giuliani
Location
Department of Materials
Royal School of MinesSupport with
Focused ion beam milling, in situ TEM and SEM.
-
Dr Mahmoud Ardakani
Personal details
Dr Mahmoud Ardakani Research Facility Manager Harvey Flowers Electron Microscopy SuiteSend email+44 (0)7907979263
Location
Department of Materials
Royal School of Mines
Lower Ground Floor, LG05Support with
JEOL 2100Plus TEMJEOL 2100F TEM
Zeiss LEO Gemini 1525 SEM
Zeiss Auriga Cross Beam FIB-SEM
Zeiss Sigma 300 SEM
Sample Preparation
FEGSEM Quanta -
Dr Catriona McGilvery
Location
Department of Materials
Royal School of Mines
Lower Ground Floor, LGM 05KSupport with
TFS Spectra 300 TEM
TFS Talos microscope
EELS
Cryo-TEM -
Dr Cati Ware
Location
Department of Materials
Royal School of Mines
Lower Ground Floor, LG05Support with
Electron Microscopy
TFS Helios 5 CX
SEM and TEM/FIB sample preparation for materials characterisation -
Dr James Owen Douglas
Location
Department of Materials
Royal School of Mines
Lower Ground Floor, LGM 05KSupport with
Atom Probe tomography
General queries about Atom Probe Tomography and associated sample preparation.
Cameca LEAP 5000 XR.