Instrumentation

The Surface Analysis Facility incorporates SIMS, LEIS, FIB and optical interferometry. The facility provides state-of-the-art analyses of a wide range of surfaces using time of flight secondary ion mass spectrometry (ToF-SIMS), low energy ion scattering (LEIS), and focussed ion beam (FIB) microscopy with secondary ion mass spectrometry (SIMS).

ToF-SIMS is an ultra-high vacuum-based technique for measuring the chemical nature of atoms at and near the surface of materials. The sensitivity of the measurement is often better than parts per million, and the spatial resolution can be within the nano-scale.

Low energy ion scattering (LEIS) is a highly surface-sensitive technique that can measure the chemical composition of just the first atomic monolayer. The facility is unique to the UK and one of a few worldwide.

The above two techniques are interconnected, allowing sample interchange without exposure to the atmosphere and maintaining UHV conditions. Sample preparation facilities are available for top atom and molecule layer characterisation by LEIS and SIMS.

The microscope-based coherence scanning interferometer enables high-resolution measurement of surface topography, including sputtered crater depths.

Research is undertaken at the surface analysis facility in various disciplines, including but not limited to oxide materials for fuel cells, biomaterials, functional nanomaterials, and energy and transportation materials. Much of the research, such as materials for fuel cells, relies on the facility’s isotopic tracer labelling facility and Matlab-based modelling routines to interpret the tracer fraction profile. Research in the facility has resulted in over 40 PhDs and 500 publications.

Surface Analysis Facility

Surface Analysis Facility

Surface Analysis Facility

Surface Analysis Facility

Surface Analysis Facility

Surface Analysis Facility

Surface Analysis Facility help and support

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  • Professor Stephen Skinner

    Personal details

    Professor Stephen Skinner Academic Lead - Surface Analysis Facilities

    +44 (0)20 7594 6782

    Location

    Department of Materials
    Royal School of Mines 
    2.06, 2nd Floor

    Support with

    Full consultations to access the Surface Analysis Facility

  • Dr Sarah Fearn

    Personal details

    Dr Sarah Fearn Research Officer, Surface Analysis

    +44 (0)20 7594 6740

    Location

    Department of Materials
    Royal School of Mines
    Lower Ground Floor, LG62A

    Support with

    Full consultations to access the Surface Analysis Facility and the the IONTOF TOF.SIMS 5 -Qtac 100 LEIS instrument

  • Dr Richard Chater

    Personal details

    Dr Richard Chater Senior Research Officer, Surface Analysis

    +44 (0)20 7594 6740

    Location

    Department of Materials
    Royal School of Mines
    Lower Ground Floor, LG62A

    Support with

    FEI FIB-SIMS and Zygo NewView 200