TFS Spectra 300

Details about the Spectra 300 Scanning Transmission Electron Microscope X-FEG/UltiMono can be found below.

Access to atomic information: The Department of Materials Spectra 300 is a probe-corrected Scanning Transmission Electron Microscope (TEM), equipped with an ultra-high-resolution X-FEG Ulti-monochromator. The ultimate STEM spatial resolution is 50 pm @300 kV, allowing users to observe even slit shifts in atomic positions within unit cells, such as the octahedral tilting of oxides. 

Atomic resolution elemental analysis: The Spectra TEM is equipped with a Dual-X energy dispersive X-ray (EDX) detector and an in-situ Gatan Continuum K3 (80-300 kV) with switchable FXUP camera for lower kV experiments (60-300 kV). 

The X-FEG/Mono can be automatically tuned from 1 eV down to 0.2 eV, while the X-FEG/UltiMono can be automatically tuned from 1 eV down to <30 meV, allowing for the measurement of local bandgap changes within material interfaces. 

Electron diffraction: The Spectra TEM has been set up for 4D-STEM using either the Ceta camera or the K3 direct electron detector. Lorentz mode STEM alignments allow users to conduct electron diffraction experiments also within a ‘field free’ environment that is essential for most magnetic samples. The Nanomegas additional equipment and software can be used to for precision electron diffraction experiments.  

Cryogenic and In-situ TEM Holders: Several cryogenic and in-situ related TEM holders are part of the suite, including Gatan Liquid nitrogen (LN2) Cryogenic transfer single tilt, Gatan double tilt LN2 holder, Melbuild LN2 Cooling, Double Tilt and Vacuum Transfer TEM holder, in-situ DENSsolutions cooling and biasing holder, in-situ DENSsolutions Stream liquid and biasing or heating holder, in-situ Protochips heating and biasing holder.