JEOL 2100F TEM

The TEM is routinely used for characterising the microstructure at interfaces in ceramics, Metals and  Biological samples. Morphology and distribution of nano-size particles, lattice imaging and chemical analysis can be studied.

The TEM is computer-controlled allowing users to record operation conditions, recall stored sample grid positions and perform low-dose imaging. This is useful for examining biological samples that are sensitive to the high-energy electron beam. To record high-resolution images using less energetic beams, the instrument is fitted with a Gatan Orius SC 1000 camera (2×4k) GIF Ultras-can camera (2k×2k), high-angle annular dark field detector, a Gatan annular dark field detector/bright field detector, as well as a Gatan Quantum image filter (GIF) system.

Further chemical analysis can be carried out on the Oxford Instruments INCA/Aztech EDS 80 mm X-Max detector system, which is capable of light-element (Z>5) and can be combined with STEM for nanometre spatial resolution.

JEOL JEM-2100F TEM help and support