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@article{Moser:2016:10.1109/JSEN.2016.2585920,
author = {Moser, N and Lande, TS and Toumazou, C and Georgiou, P},
doi = {10.1109/JSEN.2016.2585920},
journal = {IEEE Sensors Journal},
pages = {6496--6514},
title = {ISFETs in CMOS and Emergent Trends in Instrumentation: A Review},
url = {http://dx.doi.org/10.1109/JSEN.2016.2585920},
volume = {16},
year = {2016}
}

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TY  - JOUR
AB  - Over the past decade, ion-sensitive field-effect transistors (ISFETs) have played a major role in enabling the fabrication of fully integrated CMOS-based chemical sensing systems. This has allowed several new application areas, with the most promising being the fields of ion imaging and full genome sequencing. This paper reviews the new trends in front-end topologies toward the design of ISFET sensing arrays in CMOS for these new applications. More than a decade after the review of the ISFET by Bergveld which summarized the state of the art in terms of device and early readout circuity, we describe the evolution in terms of device macromodel and identify the main sensor challenges for current designers. We analyze the techniques that have been reported for both ISFET instrumentation and compensation, and conclude that topologies are focusing on device adaptation for offset and drift cancellation, as opposed to system compensation which are often not as robust. Guidelines are provided to build a tailored CMOS ISFET array, emphasizing that the needs in terms of applications are the keys to selecting the right pixel architecture. Over the next few years, the race for the largest and densest array is likely to be put on hold to allow the research to focus on new pixel topologies, ultimately leading to the development of reliable and scalable arrays. A wide range of new applications are expected to motivate this paper for at least another decade.
AU  - Moser,N
AU  - Lande,TS
AU  - Toumazou,C
AU  - Georgiou,P
DO  - 10.1109/JSEN.2016.2585920
EP  - 6514
PY  - 2016///
SN  - 1530-437X
SP  - 6496
TI  - ISFETs in CMOS and Emergent Trends in Instrumentation: A Review
T2  - IEEE Sensors Journal
UR  - http://dx.doi.org/10.1109/JSEN.2016.2585920
VL  - 16
ER  -

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