NTMDT NTEGRA Spectra AFM/Raman system
Our AFM/Raman system with upright and inverted microscope enable the phenomenon of tip-enhanced Raman to be exploited for a variety of samples, with laser illumination from the top or underside of the sample. The presence of the AFM tip near the sample surface within the beam of Raman laser gives an enhanced Raman signal from the tip, giving a spatial resolution well below the diffraction limit of the laser.
